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Facilities

Copyright © 2008 Jayesh Bellare; Designed by Sagar , Manu & Jaiswal. All rights reserved.
Microscopy
Optical:
Electron:
Probe:
Polarizing microscopy
Confocal Microscopy
SEM
TEM
HRTEM
AFM
STM
Scattering
Galai Particle Analyser
QELS/DLS
SAXS
Flow Cytometry
FACS
Others
BET
Cryogrinder
Electrospinning unit
Lyophilizer
Rotavap
UV Vis Spec
Microscopy
Polarizing microscopy
Polarizing optical microscopy employs polarized light and is especially suited for isotropic materials. The technique can be used both qualitatively and quantitatively and is an outstanding tool for materials science, geology, chemistry, biology, metallurgy and even medicine.
Key features: Olympus BX51
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Confocal microscopy
Confocal microscopy can improve conventional fluorescence images by recording fluorescence generated from the focal plane within the sample, while rejecting all other light coming from above or below the focal plane.
Key features: Olympus IX81 FV500
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Transmission Electron Microscope (TEM)
Fundamental research within the scope of cell biology, structural biology, soft matter and (bio)- nanotechnology requires investigations down to the atomic level. TEMs are of paramount importance to obtain high magnification and high resolution 2D and 3D information of cells and organelles or even smaller cell constituents.
Key features: FEI Tecnai G2 12
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High Resolution Transmission Electron Microscope (HRTEM)
High-resolution transmission electron microscope (HR-TEM) with excellent analytical performance for daily use in a multi-user environment. The configuration of the instrument combine ease-of-use with capability for routine atomic resolution imaging of crystal lattices by coherent electron scattering or phase contrast (TEM) and by incoherent electron scattering or Z-contrast in the scanning transmission electron microscopy (STEM) mode.
Key features: JEOL JEM-2100
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Atomic Force Microscope (AFM)
Atomic force microscope (AFM) or scanning force microscope (SFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Used for visualization and measurement of surface features having nanometer sized dimensions
Key features: Nanosurf Easy Scan2
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Scanning Tunelling Microscope (STM)
Scanning tunneling microscope (STM) is a powerful technique for viewing surfaces at the atomic level.STM probes the density of states of a material using tunneling current. When a conducting tip is brought very near to a metallic or semiconducting surface, a bias between the two can allow electrons to tunnel through the vacuum between them.Uses of STM to study metals and semiconductors surface can provide non-trivial real space information.
Key features: Nanosurf Easy Scan2
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Scanning Electron Microscope (SEM)
SEM uses electrons to give high resolution and high depth of field and is especially suited for deciphering the surface features of the sample. Specifically, it provides information on the shape, size and arrangement of the particles making up the object that are lying on the surface of the sample or have been exposed by grinding or chemical etching; detectable features limited to a few manometers
Key features: JEOL 6400
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Light Scattering occurs when polarizable particles in a sample are bathed in the oscillating electric field of a beam of light. The short-term intensity fluctuations (dynamics) of the scattered light arise from the fact that the scattering particles are undergoing rapid thermal motions. These movements are called Brownian motion. The varying field induces oscillating dipoles in the particles and these radiate light in all directions.
Key features: Galai CIS 1
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Scattering
Galai Particle Analyzer
In this method the dynamics of the scattered light are determined and analyzed. Typical applications of the method include Particle size distributions; Particle aggregation phenomena; Micellar systems; Micro-emulsion technology; Colloid behavior; Particle size growth; Nucleation processes & protein crystallization.
Key features: BI-200SM; Central facility
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Quasi-Electric Light Scattering (QELS)/ Dynamic Light Scattering (DLS)
SAXS is an analytical method to determine the structure of particle systems in terms of averaged sizes or shapes. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. Applications are very broad and include the metal, cement, oil, polymer, plastics, food and pharmaceutical industries.
Key features: Anton Paar SAXSess
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Small-Angle X-ray Scattering (SAXS)
FACS is a celluar technique that is based on flow cytometry. It employs fluorescence detection coupled with size/granularity to sort, count and examine the cells. The fundamental element is the ability to monitor and modulate multiple parameters in a single experiment
Key features: BD FACSAria (SOS); Central facility
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Flow Cytometry
Fluorescence-activated Cell Sorter (FACS)
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The multi-disciplinary nature of our work necessitates the use of diverse equipments and instruments. Our work draws heavily from the listed facilities, some of which are collaborative in nature.